| Cstl_adc_config_mask_t | Application-provided mask describing which SAR ADC instance configuration fields are legitimately changed by the application at runtime and must be excluded by SelfTest_ADC_Config_Save and SelfTest_ADC_Config_Verify |
| Cstl_adc_config_snapshot_t | CRC-protected snapshot of one SAR2 ADC instance's configuration registers |
| Cstl_adc_mmio_config_mask_t | Application-provided mask for the registers in stl_adc_mmio_config_snapshot_t |
| Cstl_adc_mmio_config_snapshot_t | CRC-protected snapshot of the PASS-level registers shared by every SAR2 ADC instance (PASS0->EPASS_MMIO) |
| Cstl_atop_adc_core_config_t | Configuration for one ADC Core self-test run |
| Cstl_atop_afe_config_t | Configuration for one AFE gain self-test run |
| Cstl_clock_csv_entry_t | CSV self-test entry |
| Cstl_ecc_flash_cfg_t | Flash ECC runtime configuration contract |
| Cstl_ecc_flash_counters_t | Flash ECC event counters |
| Cstl_ecc_flash_event_t | Decoded Flash ECC event |
| Cstl_ecc_flash_snapshot_t | Hardware evidence captured for one FAULT_STRUCT0 record |
| Cstl_ecc_ram_cfg_t | RAM ECC runtime configuration contract for one RAMC instance |
| Cstl_ecc_ram_counters_t | RAM ECC event counters |
| Cstl_ecc_ram_event_t | Decoded RAM ECC event |
| Cstl_ecc_ram_snapshot_t | Hardware evidence captured for one FAULT_STRUCT0 record |
| Cstl_motif_cfg_handle_t | MOTIF self test configuration structure |
| Cstl_motif_tcpwm_cfg_t | TCPWM configuration sub-structure |
| Cstl_motif_tcpwm_counter_cfg_t | TCPWM counter configuration sub-structure |
| Cstl_mpu_entry_t | Entry parameters for SelfTest_MPU(), supplied by the application |
| Cstl_ppu_entry_t | Entry parameters for SelfTest_PPU(), supplied by the application |
| Cstl_smpu_entry_t | Entry parameters for SelfTest_SMPU(), supplied by the application |