ModusToolbox Safety Test Library
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Data Structures

General Description

Data Structures

struct  stl_ecc_flash_cfg_t
 Flash ECC runtime configuration contract. More...
struct  stl_ecc_flash_snapshot_t
 Hardware evidence captured for one FAULT_STRUCT0 record. More...
struct  stl_ecc_flash_event_t
 Decoded Flash ECC event. More...
struct  stl_ecc_flash_counters_t
 Flash ECC event counters. More...
struct  stl_ecc_ram_cfg_t
 RAM ECC runtime configuration contract for one RAMC instance. More...
struct  stl_ecc_ram_snapshot_t
 Hardware evidence captured for one FAULT_STRUCT0 record. More...
struct  stl_ecc_ram_event_t
 Decoded RAM ECC event. More...
struct  stl_ecc_ram_counters_t
 RAM ECC event counters. More...

Data Structure Documentation

◆ stl_ecc_flash_cfg_t

struct stl_ecc_flash_cfg_t
Data Fields
bool eccEnable Required configuration: FLASH_CTL.ECC_EN target state.

Must be true.

bool rbusErrSilent Required configuration: FLASH_CTL.RBUS_ERR_SILENT target state.

Must be false.

bool checkFlashMacroEncoder When true, FM_CTL.ANA_CTL0.ECC_ENC_DIS is additionally verified to be 0.

The recommended value is true, which requires the caller to run in the Secure Main CM33 context: the Flash Macro register block is protection context restricted. An image that cannot read it must pass false, otherwise this read-only check itself raises a fault.

◆ stl_ecc_flash_snapshot_t

struct stl_ecc_flash_snapshot_t
Data Fields
uint32_t faultSource Fault source index reported by Cy_SysFault_GetErrorSource().
bool faultValid Fault record valid status at capture time.
uint32_t data[4] FAULT_STRUCT0 DATA0 to DATA3 as captured.
uint32_t flashCtl FLASHC.FLASH_CTL evidence at capture time.
uint32_t eccLogir FLASHC.ECC_LOGIR evidence at capture time.

◆ stl_ecc_flash_event_t

struct stl_ecc_flash_event_t
Data Fields
stl_ecc_flash_event_kind_t kind Event classification.
uint32_t wordAddress DATA0 word address; valid only when kind is not NONE.
uint32_t offset Byte offset of the ECC word in the Flash main region.
uint32_t address STL_ECC_FLASH_MAIN_BASE + offset; the bus alias is not reported by hardware and is a software assumption.
uint16_t syndrome DATA1[8:0] SECDED syndrome.
uint16_t ecc1Cnt ECC_LOGIR.ECC1CNT evidence copied from the snapshot.
uint16_t eccThreshold ECC_LOGIR.ECCTHRESHOLD evidence copied from the snapshot.

◆ stl_ecc_flash_counters_t

struct stl_ecc_flash_counters_t
Data Fields
uint32_t correctable Correctable-threshold events counted.

Saturates.

uint32_t nonCorrectable Non-correctable events counted.

Saturates.

uint32_t other Records of other fault sources counted.

Saturates.

stl_ecc_flash_event_t last Last Flash ECC event; not updated for other sources.

◆ stl_ecc_ram_cfg_t

struct stl_ecc_ram_cfg_t
Data Fields
bool eccEnable RAMC.ECC_CTL.EN target state.

Must be true.

bool autoCorrect RAMC.ECC_CTL.AUTO_CORRECT target state.

Must be true.

bool checkEnable RAMC.ECC_CTL.CHECK_EN target state.

◆ stl_ecc_ram_snapshot_t

struct stl_ecc_ram_snapshot_t
Data Fields
uint32_t faultSource Source index from Cy_SysFault_GetErrorSource().
bool faultValid Fault record valid status at capture time.
uint32_t data[4] FAULT_STRUCT0 DATA0 to DATA3 as captured.
uint32_t eccCtl[STL_ECC_RAM_INSTANCES] RAMCn.ECC_CTL evidence at capture time.
uint32_t eccStatus0[STL_ECC_RAM_INSTANCES] RAMCn.ECC_STATUS0 evidence at capture time.
uint32_t eccStatus1[STL_ECC_RAM_INSTANCES] RAMCn.ECC_STATUS1 evidence at capture time.

◆ stl_ecc_ram_event_t

struct stl_ecc_ram_event_t
Data Fields
stl_ecc_ram_event_kind_t kind Event classification.
uint32_t ramcIdx Reporting RAMC instance.
uint32_t address DATA0 as reported, including the bus alias.
uint16_t syndrome DATA1[6:0] SECDED syndrome.

◆ stl_ecc_ram_counters_t

struct stl_ecc_ram_counters_t
Data Fields
uint32_t correctable Correctable events counted.

Saturates.

uint32_t nonCorrectable Non-correctable events counted.

Saturates.

uint32_t other Records of other fault sources counted.

Saturates.

stl_ecc_ram_event_t last Last RAM ECC event; not updated for other sources.