CAT2 Peripheral Driver Library
Data Fields
cy_stc_lin_test_config_t Struct Reference
LIN (Local Interconnect Network) » Data Structures

Description

LIN Test configuration.

This testing functionality simplifies SW development, but may also be used in the field to verify correct channel functionality.

Data Fields

uint8_t chidx
 Specifies the channel index of the channel to which the test applies. More...
 
bool mode
 When set FALSE, it is partial disconnect from IOSS. More...
 

Field Documentation

◆ chidx

uint8_t cy_stc_lin_test_config_t::chidx

Specifies the channel index of the channel to which the test applies.

The test mode allows BOTH of the two connected channels to be tested.

◆ mode

bool cy_stc_lin_test_config_t::mode

When set FALSE, it is partial disconnect from IOSS.

Used to observe messages outside of device. When Set TRUE, it is full disconnect from IOSS. Used for device test without effecting operational LIN cluster.