Built-in Self-test Macros

General Description

Built-in Self-test macros.

Macros
#define	CY_CAPSENSE_BIST_CRC_WDGT_MASK   ((uint32_t)CY_CAPSENSE_TST_WDGT_CRC_EN << 0uL)
	The mask for a widget CRC test.
#define	CY_CAPSENSE_BIST_BSLN_INTEGRITY_MASK   ((uint32_t)CY_CAPSENSE_TST_BSLN_INTEGRITY_EN << 1uL)
	The mask for a baseline integrity test.
#define	CY_CAPSENSE_BIST_RAW_INTEGRITY_MASK   ((uint32_t)CY_CAPSENSE_TST_RAW_INTEGRITY_EN << 2uL)
	The mask for a rawcount integrity test.
#define	CY_CAPSENSE_BIST_SNS_INTEGRITY_MASK   ((uint32_t)CY_CAPSENSE_TST_SNS_SHORT_EN << 3uL)
	The mask for a pin integrity test.
#define	CY_CAPSENSE_BIST_SNS_CAP_MASK   ((uint32_t)CY_CAPSENSE_TST_SNS_CAP_EN << 4uL)
	The mask for a sensor capacitance measurement test.
#define	CY_CAPSENSE_BIST_SHIELD_CAP_MASK   ((uint32_t)CY_CAPSENSE_TST_SH_CAP_EN << 5uL)
	The mask for a shield capacitance measurement test.
#define	CY_CAPSENSE_BIST_EXTERNAL_CAP_MASK   ((uint32_t)CY_CAPSENSE_TST_EXTERNAL_CAP_EN << 6uL)
	The mask for an external capacitor capacitance measurement test.
#define	CY_CAPSENSE_BIST_VDDA_MASK   ((uint32_t)CY_CAPSENSE_TST_VDDA_EN << 7uL)
	The mask for a VDDA measurement test.
#define	CY_CAPSENSE_BIST_ELTD_CAP_MASK   ((uint32_t)CY_CAPSENSE_TST_ELTD_CAP_EN << 8uL)
	The mask for an electrode capacitance measurement test.
#define	CY_CAPSENSE_BIST_RUN_AVAILABLE_SELF_TEST_MASK
	The mask for all enabled self-test functions. More...
#define	CY_CAPSENSE_TST_MEASUREMENT_GROUP_EN
	The mask for all enabled measurement self-test functions. More...
#define	CY_CAPSENSE_TST_HW_GROUP_EN
	The mask for all enabled self-test functions which changes HW configuration. More...
#define	CY_CAPSENSE_BIST_EXT_CAP_SERIAL_RESISTANCE   (1000u)
	The estimated serial resistance value of the external capacitor charging/discharging circuit including GPIO, AMuxBus, PCB and all another resistances. More...

Macro Definition Documentation

CY_CAPSENSE_BIST_RUN_AVAILABLE_SELF_TEST_MASK

#define CY_CAPSENSE_BIST_RUN_AVAILABLE_SELF_TEST_MASK

Value:

(CY_CAPSENSE_BIST_CRC_WDGT_MASK | \
                                                                     CY_CAPSENSE_BIST_SNS_INTEGRITY_MASK | \
                                                                     CY_CAPSENSE_BIST_SNS_CAP_MASK | \
                                                                     CY_CAPSENSE_BIST_EXTERNAL_CAP_MASK |\
                                                                     CY_CAPSENSE_BIST_VDDA_MASK |\
                                                                     CY_CAPSENSE_BIST_SHIELD_CAP_MASK)

The mask for all enabled self-test functions.

CY_CAPSENSE_TST_MEASUREMENT_GROUP_EN

#define CY_CAPSENSE_TST_MEASUREMENT_GROUP_EN

Value:

(CY_CAPSENSE_BIST_EN && \
                                                                     (CY_CAPSENSE_TST_SNS_CAP_EN || \
                                                                      CY_CAPSENSE_TST_SH_CAP_EN ||\
                                                                      CY_CAPSENSE_TST_VDDA_EN ||\
                                                                      CY_CAPSENSE_TST_EXTERNAL_CAP_EN))

The mask for all enabled measurement self-test functions.

CY_CAPSENSE_TST_HW_GROUP_EN

#define CY_CAPSENSE_TST_HW_GROUP_EN

Value:

(CY_CAPSENSE_BIST_EN && \
                                                                     (CY_CAPSENSE_TST_SNS_SHORT_EN ||\
                                                                      CY_CAPSENSE_TST_MEASUREMENT_GROUP_EN))

The mask for all enabled self-test functions which changes HW configuration.

CY_CAPSENSE_BIST_EXT_CAP_SERIAL_RESISTANCE

#define CY_CAPSENSE_BIST_EXT_CAP_SERIAL_RESISTANCE   (1000u)

The estimated serial resistance value of the external capacitor charging/discharging circuit including GPIO, AMuxBus, PCB and all another resistances.

The value is used for the external capacitor charging/discharging time estimations