RAM (RAM STL module)

General Description

To meet the Class B requirement, SRAM test must be checked for DC fault.

Either of the two tests (both are destructive) can be used:

 1) March/Checkerboard: The RAM area is written
                        with  alternate “0” and “1” to memory, and verifies if the
                        written data is correct by reading back.
 2) GALPAT:             This test initilizes the chosen
                        range of memory uniformly (i.e. all 0 s or all 1 s). The first
                        memory cell to be tested is then inverted and all the remaining
                        cells are inspected for the correct contents.
                        After every read access to one of the remaining cells, the inverted
                        cell is also checked. This procedure is repeated for each cell
                        in the chosen memory range. A second run is done with the
                        opposite initialisation. Any difference produces a failure message.
                        It can detect stuck-at faults and direct coupling faults.

Note

GALPAT test is time consuming. These tests can be implemented at the startup procedure to test entire SRAM area

API Reference
	Enumerated Types
	SRAM
	STACK