Macros | |
| #define | ANALOG_TEST_VREF (ANALOG_TEST_VREF_EXTERNAL) |
| The test is done by using Vref from External. | |
| #define | ANALOG_TEST_VREF_EXTERNAL (0u) |
| Depends on an external three-series resistor voltage divider from VDDA to GND to supply a reference voltage for the self test. | |
| #define | ANALOG_TEST_VREF_DUAL_MSC (1u) |
| Uses the two internal MSCv3 blocks to route VREF(1.2V) and VDDA/2 to the AMUXBUS, which the tests can use. | |
| #define | ANALOG_TEST_VREF_CSD_IDAC (2u) |
| Uses an internal CSD IDAC to generate a voltage from an external pull-down resistor. | |
| #define | ADC_TEST_ACC 12 |
| ADC accuracy: 12%. | |
| #define | OPAMP_TEST_ACCURACY 12 |
| OPAMP accuracy - the same as ADC accuracy. | |
| #define | EXTERNAL_VREF1_MV ((CY_CFG_PWR_VDDA_MV*1)/3) |
| External reference voltage 1 (VDDA / 3) using a three-resistor voltage divider. | |
| #define | EXTERNAL_VREF2_MV ((CY_CFG_PWR_VDDA_MV*2)/3) |
| External reference voltage 2 (2 * VDDA / 3) using a three-resistor voltage divider. | |
| #define | ANALOG_TEST_VREF1_MV (EXTERNAL_VREF1_MV) |
| Selected test reference voltage 1. | |
| #define | ANALOG_TEST_VREF2_MV (EXTERNAL_VREF2_MV) |
| Selected test reference voltage 2. | |
| #define | ANALOG_ADC_CHNL_OPAMP 0x00u |
| ADC channel to read OPAMP output. | |
| #define | ANALOG_OPAMP_ACCURACY ((CY_CFG_PWR_VDDA_MV * OPAMP_TEST_ACCURACY) / 100) |
| OPAMP Accuracy in counts. | |
| #define | ANALOG_OPAMP_SAR_RESULT1 (ANALOG_TEST_VREF1_MV) |
| Expected OPAMP SAR result for ANALOG_TEST_VREF1_MV. | |
| #define | ANALOG_OPAMP_SAR_RESULT2 (ANALOG_TEST_VREF2_MV) |
| Expected OPAMP SAR result for ANALOG_TEST_VREF2_MV. | |
| #define | ANALOG_ADC_ACCURACY ((CY_CFG_PWR_VDDA_MV * ADC_TEST_ACC) / 100) |
| ADC Accuracy in counts. | |
| #define | ANALOG_ADC_SAR_RESULT1 (ANALOG_TEST_VREF1_MV) |
| Expected SAR result for ANALOG_TEST_VREF1_MV. | |
| #define | ANALOG_ADC_SAR_RESULT2 (ANALOG_TEST_VREF2_MV) |
| Expected SAR result for ANALOG_TEST_VREF2_MV. | |
| #define | ADC_TEST_CON_TIME_uS (1000u) |
| ADC conversion time in test mode, uS. | |
| #define | ANALOG_COMP_RESULT1 (1u) |
| Expected COMP result when +ve terminal voltage > -ve terminal Voltage. | |
| #define | ANALOG_COMP_RESULT2 (0u) |
| Expected COMP result when +ve terminal voltage < -ve terminal Voltage. | |
| #define ANALOG_TEST_VREF_DUAL_MSC (1u) |
Uses the two internal MSCv3 blocks to route VREF(1.2V) and VDDA/2 to the AMUXBUS, which the tests can use.
Only for PSOC 4 devices.
| #define ANALOG_TEST_VREF_CSD_IDAC (2u) |
Uses an internal CSD IDAC to generate a voltage from an external pull-down resistor.
Only for PSOC 4 devices.
| #define ANALOG_ADC_CHNL_OPAMP 0x00u |
ADC channel to read OPAMP output.
Only for PSOC 4 devices.