Functions

General Description

Functions
uint8_t	SelfTests_Opamp (SAR_Type *sar_base, int16_t expected_res, int16_t accuracy, uint32_t opamp_in_channel, bool count_to_mV)
	Performs OPAMP test and verifies if the measured voltage is in the accuracy range.
uint8_t	SelfTests_ADC_TrigIn (uint32_t group, uint32_t channel, int32_t expected_res, int32_t accuracy, uint32_t trig_in)
	Performs an ADC self-test by issuing a firmware SAR trigger and verifying that the measured result falls within the expected range.
uint8_t	SelfTests_ADC (SAR_Type *base, uint32_t channel, int16_t expected_res, int16_t accuracy, uint32_t vbg_channel, bool count_to_mV)
	Performs ADC test and verifies if the measured voltage is in the accuracy range.
uint8_t	SelfTests_Comparator (LPCOMP_Type const *lpcomp_base, cy_en_lpcomp_channel_t lpcomp_channel, uint8_t expected_res)
	Performs Comparator test and verifies if the higher voltage on +ve terminal compared to -ve terminal generates a high output and vice verse.
uint8_t	SelfTests_DAC (CTDAC_Type *dacBase, SAR_Type *adcBase, uint32_t adcChannel)
	Performs DAC test and verifies that the input of DAC and output from ADC are the same.
uint8_t	SelfTests_DAC_TrigIn (uint32_t adc_channel, uint32_t dac_slice, uint32_t dac_val, int16_t expected_res, int16_t accuracy, uint32_t adc_trig_in, uint32_t dac_trig_in)
	Performs DAC test and verifies that the input of DAC and output from ADC are the same.

Function Documentation

SelfTests_Opamp()

uint8_t SelfTests_Opamp	(	SAR_Type *	sar_base,
		int16_t	expected_res,
		int16_t	accuracy,
		uint32_t	opamp_in_channel,
		bool	count_to_mV )

Performs OPAMP test and verifies if the measured voltage is in the accuracy range.

Parameters

sar_base	The pointer to a SAR ADC instance.
expected_res	If count_to_mV = 1 => Expected result in mV, else Expected result in counts.
accuracy	Accuracy in count ANALOG_OPAMP_ACCURACY
opamp_in_channel	Channel number where the OPAMP output is read.
count_to_mV	1 = convert the count to mV.(take more time)

Returns

OK_STATUS (0) - Test passed
ERROR_STATUS (1) - Test failed

SelfTests_ADC_TrigIn()

uint8_t SelfTests_ADC_TrigIn	(	uint32_t	group,
		uint32_t	channel,
		int32_t	expected_res,
		int32_t	accuracy,
		uint32_t	trig_in )

Performs an ADC self-test by issuing a firmware SAR trigger and verifying that the measured result falls within the expected range.

HPPASS subsystem configuration and signal routing:
The test uses the CSG VDAC (pass[0].csg[0].slice[0]) as an internally generated stimulus so that no external reference voltage is required on any device pin. The complete analog signal path through the HPPASS block is:

CSG Group 0, Slice 0 (VDAC, buffered, 10-bit) → CSG analog router (dacOutSelLoc = 1) → SAR muxed sampler input → SAR channel CSG_VDAC_OUT_CHAN_IDX (defined in cycfg_peripherals.h)

The following HPPASS configurations are required:

• CSG[0]: Group 0 power enabled (grpPwrEn0 = true), CSG AROUTE mux not used (arouteMuxSel0 = CY_HPPASS_CSG_AROUTE_NONE), DAC output location 1 (dacOutSelLoc = 1, routes the VDAC output to the HPPASS analog router so the SAR muxed sampler can reach it).
• CSG[0] Slice 0: mode = CY_HPPASS_DAC_MODE_BUFFERED (10-bit VDAC with output buffer).
• HPPASS input trigger 2 (pass[0].input_trigger[2]): CY_HPPASS_TR_FW_PULSE — used to fire the SAR sequencer group that samples the DAC output (passed as trig_in = CY_HPPASS_TRIG_2_MSK).
• SAR[0]: Vref = CY_HPPASS_SAR_VREF_VDDA, 12-bit result, right-aligned, unsigned. Muxed sampler 0 (pass[0].sar[0].muxed_sampler[0]) connected to the CSG VDAC analog router output.
• SAR[0] sequencer group (pass[0].sar[0].seq[0].grp[N]): muxed sampler 0 enabled (muxSampEn0 = true), mux input select pointing to the CSG VDAC output, trigger = CY_HPPASS_SAR_TRIG_2 (corresponding to trig_in). The result is stored in SAR channel CSG_VDAC_OUT_CHAN_IDX.
• Autonomous Controller (pass[0].ac[0]): the HPPASS AC must be started (Cy_HPPASS_AC_Start()) before any SAR conversion can be triggered. The AC Finite State Automaton (FSA) must be configured with at least one state (pass[0].ac[0].stt[0].vstate[0]) that keeps the subsystem running, e.g. action = CY_HPPASS_ACTION_STOP with count = 1. The AC holds the HPPASS clock and power rails active; without it the SAR trigger is ignored.

The caller must pre-stage the DAC stimulus before calling this function: program the desired 10-bit code with Cy_HPPASS_DAC_SetValue(), start the DAC slice with Cy_HPPASS_DAC_Start() in HW mode, and wait for the DAC to settle before invoking SelfTests_ADC_TrigIn(). This function then issues the SAR trigger specified by trig_in and reads the conversion result from channel.

Parameters

group	SAR group instance (0 for SAR[0]).
channel	SAR channel index where the DAC stimulus is sampled. Use the macro CSG_VDAC_OUT_CHAN_IDX generated in cycfg_peripherals.h for the target BSP.
expected_res	Expected ADC result in counts (12-bit, Vref = VDDA).
accuracy	Acceptable deviation from expected_res in counts (ANALOG_ADC_ACCURACY).
trig_in	HPPASS input trigger mask that fires the SAR sequencer group containing the muxed sampler channel (e.g. CY_HPPASS_TRIG_2_MSK).

Returns

OK_STATUS (0) - Test passed
ERROR_STATUS (1) - Test failed

SelfTests_ADC()

uint8_t SelfTests_ADC	(	SAR_Type *	base,
		uint32_t	channel,
		int16_t	expected_res,
		int16_t	accuracy,
		uint32_t	vbg_channel,
		bool	count_to_mV )

Performs ADC test and verifies if the measured voltage is in the accuracy range.

Parameters

base	The pointer to a SAR ADC instance. For PSOC Control C3 devices, the base is the group instance.
channel	The channel number where the input voltage needs to be read.
expected_res	If count_to_mV = 1, then the expected result in mV, else expected result in counts
accuracy	Accuracy in count ANALOG_ADC_ACCURACY
vbg_channel	The channel number where the VBG voltage is connected. Only for XMC7000 and XMC5000 devices.
count_to_mV	1 = convert the count to mV.(take more time). Not applicable for PSOC Control C3 devices.

Returns

OK_STATUS (0) - Test passed
ERROR_STATUS (1) - Test failed

Note

For CA1B devices, the user needs to configure the trigger input the same as the channel number.

SelfTests_Comparator()

uint8_t SelfTests_Comparator	(	LPCOMP_Type const *	lpcomp_base,
		cy_en_lpcomp_channel_t	lpcomp_channel,
		uint8_t	expected_res )

Performs Comparator test and verifies if the higher voltage on +ve terminal compared to -ve terminal generates a high output and vice verse.

Parameters

lpcomp_base	The pointer to a Comparator instance
lpcomp_channel	Configured channel number
expected_res	Expected result (1 or 0)

Returns

OK_STATUS (0) - Test passed
ERROR_STATUS (1) - Test failed

SelfTests_DAC()

uint8_t SelfTests_DAC	(	CTDAC_Type *	dacBase,
		SAR_Type *	adcBase,
		uint32_t	adcChannel )

Performs DAC test and verifies that the input of DAC and output from ADC are the same.

The digital input value to DAC maps to 1.5V

Parameters

dacBase	The pointer to a DAC instance.
adcBase	The pointer to a SAR ADC instance.
adcChannel	The channel number of SAR ADC instance.

Returns

OK_STATUS (0) - Test passed
ERROR_STATUS (1) - Test failed

Note

Applicable only to PSOC 61 Programmable Line and PSOC 62 Performance Line devices.

SelfTests_DAC_TrigIn()

uint8_t SelfTests_DAC_TrigIn	(	uint32_t	adc_channel,
		uint32_t	dac_slice,
		uint32_t	dac_val,
		int16_t	expected_res,
		int16_t	accuracy,
		uint32_t	adc_trig_in,
		uint32_t	dac_trig_in )

Performs DAC test and verifies that the input of DAC and output from ADC are the same.

Parameters

adc_channel	The pointer to the ADC channel.
dac_slice	The pointer to DAC slice.
dac_val	The value to be loaded into DAC register.
expected_res	Channel expected result in ADC.
accuracy	Error tolerance.
adc_trig_in	ADC trigger input.
dac_trig_in	DAC trigger input.

Returns

OK_STATUS (0) - Test passed
ERROR_STATUS (1) - Test failed

Note

Applicable only to PSOC Control C3 devices.